JPH0532908B2 - - Google Patents
Info
- Publication number
- JPH0532908B2 JPH0532908B2 JP58034157A JP3415783A JPH0532908B2 JP H0532908 B2 JPH0532908 B2 JP H0532908B2 JP 58034157 A JP58034157 A JP 58034157A JP 3415783 A JP3415783 A JP 3415783A JP H0532908 B2 JPH0532908 B2 JP H0532908B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- type
- channel mos
- breakdown voltage
- power supply
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/85—Complementary IGFETs, e.g. CMOS
- H10D84/854—Complementary IGFETs, e.g. CMOS comprising arrangements for preventing bipolar actions between the different IGFET regions, e.g. arrangements for latchup prevention
Landscapes
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58034157A JPS59158546A (ja) | 1983-02-28 | 1983-02-28 | 相補形mos集積回路装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58034157A JPS59158546A (ja) | 1983-02-28 | 1983-02-28 | 相補形mos集積回路装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59158546A JPS59158546A (ja) | 1984-09-08 |
JPH0532908B2 true JPH0532908B2 (en]) | 1993-05-18 |
Family
ID=12406364
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58034157A Granted JPS59158546A (ja) | 1983-02-28 | 1983-02-28 | 相補形mos集積回路装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59158546A (en]) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01122153A (ja) * | 1987-11-05 | 1989-05-15 | Fuji Electric Co Ltd | Cmos半導体回路装置 |
JP2508826B2 (ja) * | 1987-11-24 | 1996-06-19 | 日本電気株式会社 | 半導体装置 |
EP0357410B1 (en) * | 1988-09-01 | 1993-11-03 | Fujitsu Limited | Semiconductor integrated circuit device |
JP2011176163A (ja) * | 2010-02-25 | 2011-09-08 | Panasonic Corp | 不揮発性半導体記憶装置 |
-
1983
- 1983-02-28 JP JP58034157A patent/JPS59158546A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS59158546A (ja) | 1984-09-08 |
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